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一、引言反射云纹法由Ligtember F.k存1954年提出,在1956年～1970年间由RiederG和Ritler以及Chiang F.P。等1人对其测量光路作较大的改进用反射云纹法可直接测量弯曲变形板表面各点斜率,通过一次差分求得应变值,其测量的精确度可以满足工程上要求,但是反射云纹法要求试件表面具有良好的反射性能,若同时需获得二个方向的斜率,必须使用正交栅,然而此时所得的云纹图象反差很
I. INTRODUCTION Reflective moiré was proposed by Ligtemberk F.K. in 1954 and was co-authored by RiederG and Ritler and Chiang F. P. from 1956 to 1970 Etc. One person can greatly improve the optical path of the measurement. The reflection moiré method can directly measure the slope of each point on the surface of the bending deformation plate. The strain value can be obtained by one difference. The accuracy of the measurement can meet the engineering requirements. However, The grain method requires that the surface of the specimen has a good reflection performance. If the slope of the two directions needs to be obtained at the same time, the orthogonal grating must be used. However, the contrast of the moire obtained at this time is very poor