论文部分内容阅读
由于显微分析仪有其特点,为分析区域小,可得出微米级范围内的各种信息,可进行超软X射线的分析,且由于试样内的X射线发生深度浅,即使波长长的软X射线在试样内的吸收边较少,X射线和超软X射线的测定灵敏度比X射线荧光激发好得多。因此,利用X射线显微分析进行状态分析已逐渐引起一些研究者的注意,开展了一些研究工作。本文试图将我们进行的一点探索性工作简述如下。一、分析原理用显微分析仪从试样获得的信息种类很多,总的可划分为电子束的和电磁波的,所得到的情况是按组成物质的元素成
Due to its unique features, microscopic analyzers provide a wide range of information for the analysis of superfine X-rays because of the small size of the analysis area. Due to the shallow depth of X-rays in the sample, even if the wavelength is long Of the soft X-ray absorption edge in the sample less, X-ray and ultra-soft X-ray determination of sensitivity than X-ray fluorescence excited much better. Therefore, the use of X-ray microanalysis state analysis has gradually attracted the attention of some researchers, to carry out some research work. This article attempts to outline some of our exploratory work as follows. First, the analysis principle Microscope analyzer from the sample to obtain a lot of information, the total can be divided into the electron beam and electromagnetic waves, the resulting situation is based on the composition of the elements into