论文部分内容阅读
载体银催化剂是较理想的乙烯环氧化催化剂,在其他催化反应中也常应用.在载体表面上,银的分散度对于催化剂的活性、选择性及其寿命有很大影响.常用的银分散度测定方法有X射线粉末衍射线宽化法(简称X射线法)、透射电子显微镜法(简称TEM法)、气体吸附法等,但用这三种方法测定的结果往往并不一致. 本文除采用上述三种方法外,还用扫描电子显微镜法(简称SEM法)测定了Ag/SiO_2催化剂银的分散度,并从数据处理方法、概念和内在联系几方面对实验数据进行了讨论.
The supported silver catalyst is an ideal ethylene epoxidation catalyst and is often used in other catalytic reactions. The dispersion of silver has a great influence on the activity, selectivity and life of the catalyst on the surface of the support. The degree of determination of X-ray powder diffraction line broadening method (referred to as X-ray method), transmission electron microscopy (TEM method), gas adsorption method, but the results of these three methods are often not the same.In this paper, In addition to the above three methods, the silver dispersion of Ag / SiO 2 catalyst was also measured by scanning electron microscopy (SEM), and the experimental data were discussed in terms of data processing methods, concepts and internal relations.