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The effect of In composition on two-dimensional electron gas in wurtzite AIGaN/InGaN heterostructures is theoretically investigated.The sheet carrier density is shown to increase nearly linearly with In mole fraction x,due to the increase in the polarization charge at the AlGaN/InGaN interface.The electron sheet density is enhanced with the doping in the AlGaN layer.The sheet carrier density is as high as 3.7 × 1013 cm-2 at the donor density of 10 x 1018 cm-3 for the HEMT structure with x = 0.3.The contribution of additional donor density on the electron sheet density is nearly independent of the In mole fraction.