论文部分内容阅读
The dislocation structure in magnetron sputtered c-textured YBCO films deposited on (100)SrTiO3 substrates consists of vertical (//c axis) screw dislocation forests together with layered horizontal (|caxis) edge dislocation net-works. It is found that in the oxygenation process in YBCO films, oxygen diffusion is enhanced greatly by the short circuit paths which we suggest to be the horizontally ( c axis) layered edge dislocation net-works. Diffusion equation for oxygenation was solved with the help of Fishers theory of grain boundary diffusion, and an active energy 1.16 ev.``