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通过讨论由数据条纹、其镜像和奇偶校验组成的校验条纹的容许两个盘故障的阵列布局,给出了一种新的阵列布局策略:把校验条纹的单元划分作为阵列布局的一个主要步骤,使得容许两个故障的条件通过校验条纹的单元划分来实现。为讨论容许多个盘故障的阵列布局提供了一条新途径。给出了校验条纹的容许两个故障的单元划分条件以及多种划分。对每个l(m+2l2m+1),利用给出的l—划分,设计了一种容许两个盘故障的阵列布局方案。给出的阵列布局方案具有高的可靠性、高的吞吐量、好的I/O性能以及简单的编码和解码算法。
A new array layout strategy is given by discussing the layout of arrays that allow the failure of two disks with check stripes consisting of data stripes, their mirrors, and parity. The cell layout of the check stripes is used as one of the array layouts The main steps are such that the conditions allowing two faults are achieved by uniting the check stripes. Provides a new avenue for discussing array layouts that tolerate multiple disk failures. The cell division conditions that allow two faults for the check stripes and the various divisions are given. For each l (m + 2l2m + 1), using the given l-split, an array layout scheme that allows two disk failures is designed. Given the array layout scheme with high reliability, high throughput, good I / O performance and simple encoding and decoding algorithms.