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本文介绍一种真空紫外辐射强度测试仪的研制，仪器使用的光电管以CuI为阴极材料。测试仪的重现性良好，光谱范围从110nm到200nm，动态线性范围大于102，线性相关系数γ=0．99。
This article describes the development of a vacuum ultraviolet radiation intensity tester, the instrument used in phototransistors to CuI cathode material. Tester reproducibility is good, the spectral range from 110nm to 200nm, dynamic linear range greater than 102, the linear correlation coefficient γ = 0.99.