Incident angle of parallel light measurements based on optical vernier principle

来源 :光电子学前沿 | 被引量 : 0次 | 上传用户：liu_da_shi

【作者】

：

FeifanCHEN，ZhiweiHONG

【出处】

：

光电子学前沿

【发表日期】

：

2008年1-2期

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Incident angle of parallel light measurements based on optical vernier principle

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