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采用主动条纹偏折和相移技术提出一种新的相位物体波前测量方法。在已标定的摄像机系统中,通过相移和移动条纹显示屏可精确测量相位物体引起的成像光线偏折,从光线偏折分布中提取波前梯度分布,进而计算出待测波前分布。首先在液晶显示屏上分别显示水平和垂直两个方向的正弦灰度调制条纹图,用CCD分别记录下原始条纹图和经过待测物体后的变形条纹图,然后移动液晶显示屏,再次记录下相应的条纹图,可计算出透明相位物体引起的偏折角及其波前分布。通过对正透镜的实际测量,证明了该方法切实可行。
A new wavefront measurement method of phase object is proposed by active fringe deflection and phase shift technique. In the calibrated camera system, the phase shift and the moving stripe display can accurately measure the deflection of the imaging light caused by the phase object, and extract the wavefront gradient distribution from the light deflection distribution so as to calculate the wavefront distribution to be measured. First of all, respectively, on the LCD screen shows the horizontal and vertical directions of the two gray sine modulation stripe pattern, with the CCD were recorded under the original stripes and the deformation of the object after the deformation of the fringe pattern, and then move the LCD screen, once again recorded The corresponding fringe pattern can calculate the deflection angle caused by the transparent phase object and its wavefront distribution. The actual measurement of the positive lens proves that this method is feasible.