A 10 Gsps 8 bit digital-to-analog converter with a built-in self-test circuit

• 作 者: 周磊 吴旦昱 江帆 金智 刘新宇
• 机 构: Institute of Microelectronics,Chinese Academy of Sciences,
• 出 处: Journal of Semiconductors
• 发表日期: 2013年12期
• 关键词: converter analog BIST clock SiGe challenging pipeline segmented generator diffic

We present a 10 Gsps 8 bit digital-to-analog converter(DAC) with a novel built-in self-test(BIST) circuit,which makes it possible to evaluate the DAC’s performance without a complicated test setup.Design considerations and test results are included.According to the test results,the DAC core and the BIST circuit are able to work under 10 GHz.The chip is fabricated in 0.18 m SiGe HBTs with ft of 100 GHz.The DAC core occupies a die size of 260 250 m2.

We present a 10 Gsps 8 bit digital-to-analog converter (DAC) with a novel built-in self-test (BIST) circuit, which makes it possible to evaluate the DAC’s performance without a complicated test setup. Designations and test results are included. According to the test results, the DAC core and the BIST circuit are able to work under 10 GHz. The chip is fabricated in 0.18 m SiGe HBTs with ft of 100 GHz. The DAC core occupies a die size of 260 250 m2 .