论文部分内容阅读
用自校准方法对预先校准的四种硅光电二极管的响应均匀性进行了测量。在这种情况下,灵敏面的响应非均匀性是一个不可忽略的测不准因素。
The self-calibration method was used to measure the response uniformity of the four calibrated silicon photodiodes. In this case, the non-uniform response surface is a non-negligible uncertainty factor.