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(一)引言微波技术中常常遇到强耦合諧振腔品质因数的測試問題。如腔式微波电子器件的輸入、输出迴路,必須与外电路保持較强而又局限在一定范围內的耦合,要通过測量来进行調整,并測出共品质因数。現有的一些測量方法,都存在着这样或那样的缺点。比如通常所采用的,以測量綫測出腔体在諧振点左右的駐波此随頻率的响应曲线,定出半功率点之間的寬度,进而算出其品质因数。显然,这种方法是十
(A) Introduction Microwave technology often encounter strong coupling resonator quality factor test. Such as cavity microwave electronic devices input and output circuits, and external circuits must remain strong and limited within a certain range of coupling, to be adjusted by measuring and measuring the total quality factor. Some existing measurement methods have some shortcomings of one kind or another. Such as commonly used to measure the line cavity around the resonance point of this standing wave with the frequency response curve, set the width between the half-power points, and then calculate the quality factor. Obviously, this method is ten