Investigating the Thermal Stress of Millisecond Pulsed Laser Irradiation on Charge-Coupled Devices

• 作 者: Chunxu Jiang Yong Tan Bo Peng
• 机 构: ChangchunUniversityofScienceandTechnology,BaichengNormalUniversity,BeijingRadiumOptoelectronicTechno
• 出 处: 应用数学与应用物理(英文)
• 发表日期: 2020年11期
• 关键词: Millisecond Pulsed Laser Charge-Coupled Device Thermal Stress Raman Spectroscopy

<div style="text-align:justify;"> In this study, a two-dimensional model describing thermal stress on a charge-coupled device (CCD) induced by ms laser pulses was examined. Considering the nonlinearity of the CCD’s material parameters and