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日本东京大学合志阳一教授设计开发了“双晶X射线荧光光谱仪”。该仪器有两块分光晶体,不需要狭缝系统,并具有可在0～143°(2θ)宽波长区域扫描的一种单轴结构的波长扫描装置。该仪器用计算机进行计数管死时间较正,对谱线进行平滑化处理,将等角度间隔转换成等能量间隔,强度归一化,扣除背景计数和计算谱线参数等。同一种测定元素以多种形态形式存在时,需用适当方法(如用非线性最小二乘法)进行峰形分离,以达到定量状态分析的目的。
Koshihikari, a professor at the University of Tokyo, Japan, designed and developed a “twin X-ray fluorescence spectrometer.” The instrument has two spectroscopic crystals, does not require a slit system, and has a uniaxial wavelength scanning device that can scan over a wide wavelength range from 0 to 143 ° (2θ). The instrument uses a computer to count the tube death time is more positive, the spectral smoothing, the isometric interval is converted into equal energy interval, the intensity of normalization, background subtraction and calculation of spectral parameters. When the same kind of measurement element exists in various forms, it is necessary to separate the peak shapes by suitable methods (such as non-linear least squares method) so as to achieve the purpose of quantitative state analysis.