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如今使用晶体管图示仪对半导体三极管放大倍数进行测试的原始方案已经逐步淘汰,取而代之的是自动化较高的各种分立器件测试系统。阐述了影响测量放大倍数的因素和相关的解决方案。介绍了一种用于分立器件测试系统中的半导体三极管放大倍数脉冲测试方法,即软件调控方法。该方法是在普通的软件闭环方法的基础上引进了脉冲方案,采用了CPU控制的脉冲技术对三极管放大倍数进行间断式测量。这种软件调控的方法通过实验进行了验证,结果表明该方法符合相关测试标准,所测放大倍数与DTS-1000测量结果相差不超过±3%。
The original scheme of testing transistor magnifications today with transistor-based displays has been phased out and replaced with high-end, discrete discrete-device test systems. The factors affecting the measurement magnification and related solutions are described. A test method for measuring the magnification of semiconductor transistors in discrete device test system is introduced, which is the software control method. The method is based on a common software closed-loop approach to the introduction of the pulse program, the use of CPU-controlled pulse amplification of the transistor intermittent measurements. This method of software control was verified experimentally and the results showed that the method met the relevant test criteria and the measured magnification did not differ by more than ± 3% from the DTS-1000 measurement.