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导体故障分析是一种列举与缺陷有关的集成电路版图中可能出现桥连的技术,计算带权关键面积是限制其性能的主要因素.文中提出了一种基于数学形态学和真实缺陷矩形模型提取带权关键面积的新算法,该算法不需要将版图上的线网拆分为矩形,也不需要合并矩形对的带权关键面积.实验结果验证了新算法的有效性.
The conductor fault analysis is a technique to enumerate the possible bridging problems in the integrated circuit layout related to defects, and calculating the key area with weights is the main factor that limits its performance.In this paper, a rectangular model extraction based on mathematical morphology and real defects The new algorithm with weighted key area does not need to split the mesh on the layout into rectangles and does not require the weighted key area of the merged rectangle pairs.The experimental results verify the effectiveness of the new algorithm.