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扫描隧道显微镜(STM)是80年代初研制成功的一种新型表面分析仪器,它利用在一定电压下探针与样品之间的电子隧道效应,可在真空、液体及大气环境中获得样品表面的三维形貌图像,并具有结构简单、分辨率高、样品制备容易等特点。STM的横向分辨率可超过0.1nm,纵向分辨率可达0.01nm,因而适于观察金属和半导体样品表面微观结构及样品表面微观起伏等,在一定条件下,可以获得原子的真实图像,已经在物理、生物、材料等领域得到大量的应
Scanning Tunneling Microscope (STM) is a new type of surface analysis instrument developed in the early 1980s. It takes advantage of the electron tunneling effect between the probe and the sample under a certain voltage to obtain the surface of the sample in vacuum, liquid and atmosphere Three-dimensional topography images, and has the advantages of simple structure, high resolution, easy sample preparation and the like. STM horizontal resolution of more than 0.1nm, vertical resolution of up to 0.01nm, which is suitable for the observation of metal and semiconductor surface microstructure and sample surface micro-fluctuations, under certain conditions, you can get a real image of the atom, Physics, biology, materials and other fields get a lot of should