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原子力显微镜(AFM)不仅可用于形貌测量,而且还可在纳米尺度上测量微观组分间的相互作用力。本文简要介绍了AFM的一种令人非常感兴趣的用途——测量和推算单个化学基团对之间的作用力(单键力)。单键力的测量和推算涉及AFM针尖的自组装单分子膜的化学修饰和Poisson统计方法的利用,文中概述了测量和推算的步骤和原理。AFM应用范围的拓宽必将促进它的进一步改进和发展。
Atomic force microscopy (AFM) can be used not only for the measurement of topography, but also for measuring the forces of interaction between the microscopic components at the nanoscale. This article gives a brief introduction to one of the most interesting uses of AFM - measuring and estimating forces (single bond forces) between pairs of individual chemical groups. The measurement and calculation of the single bond force involves the chemical modification of the self-assembled monolayer of the AFM tip and the use of the Poisson statistical method, and outlines the steps and principles of measurement and inference. The widening of application scope of AFM will promote its further improvement and development.