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目前,用微处理器控制的仪器越来越多。当仪器出了故障,首先要判断是哪个部份有问题?例如,对数字电压表而言,它可分为四个部份:1、微处理器,2、A/D转换器,3、数字电路,4、电源。由于μP对大多数人来说还不熟悉,检查起来较困难,所以一般先检查4、3、2这三部份。仪器一开机就受μp的控制,所以当μp有问题时,会使仪器出故障。用传统的测试仪来检测μp是很困难的。常用的μp检测方法有三种:1、时域分析,2、特征分析,3、联机仿真。有时需要几种方法结合起来进行检测。检测μp所使用的仪器有逻辑状态分析器,如HP公司的1600A;专用的μp测试仪,如FLUKE的
At present, more and more instruments are controlled by microprocessors. For example, for digital voltmeter, it can be divided into four parts: 1, microprocessor, 2, A / D converter, 3, Digital circuit, 4, power supply. Because the μP is not familiar to most people, it is more difficult to check, so generally check 4,3,2 these three parts. The instrument is controlled by μp at startup, so when μp has a problem, it will cause the instrument to malfunction. It is very difficult to detect μp with the traditional tester. Commonly used μp detection methods are three: 1, time-domain analysis, 2, feature analysis, 3, online simulation. Sometimes you need several ways to combine it for testing. Instruments used to detect μp logic state analyzer, such as the HP company’s 1600A; dedicated μp tester, such as FLUKE’s