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本文提出了一种新型的薄膜法,可应用于工艺流程控制及地质样品中稀上分量的测定。具有制样简单,背景低,消除吸收增强效应,工作曲线线性范围大等优点。本实验室制备了一种以6卢Mylar膜为衬底,在上面再覆盖一层PMBP(1—苯基—3—甲基-4-苯甲酰-5吡唑酮)(稀土元素的优良萃取剂)的薄膜。在该膜上可一次完成常规的分离和富集过程,并制备出适合于X荧光测定的薄试样。因而大大加快了分析速度。同时该薄膜萃取剂还可应用于其它元素的分析上。
In this paper, a new type of thin film method is proposed, which can be used in the control of process flow and the determination of the lean components in geological samples. With a simple sample preparation, the background is low, to eliminate the absorption enhancement effect, the working curve of the linear range of advantages. Our laboratory prepared a 6 L Mylar film as a substrate, and then covered with a layer of PMBP (1-phenyl-3-methyl-4-benzoyl-5 pyrazolone) (rare earth element excellent Extractant) film. Conventional separation and enrichment procedures can be performed once on the membrane and a thin sample suitable for X fluorescence determination is prepared. Thus greatly accelerating the speed of analysis. At the same time the film extractant can also be applied to the analysis of other elements.