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通过溶胶-凝胶技术在Si衬底上制备了x从0.80增大到1.20的Bi x FeO3薄膜样品.分析了Bi元素含量的改变对BFO薄膜微结构和光学性质的影响,表明在Bi缺失和Bi过量的Bi x FeO3薄膜样品中均出现了Bi2Fe4O9杂相和铁氧化物杂相,导致Bi x FeO3薄膜晶格的菱形扭曲结构发生变化.测试得到了薄膜的拉曼散射谱和椭圆偏振光谱,拉曼散射谱反映了Bi x FeO3薄膜样品中的振动模式明显受到x取值的影响.根据椭偏数据拟合得到的结果表明折射率在波长600 nm以下范围内随着x的减小而减小.而样品的禁带宽度从2.65 eV到2.76 eV,在x为1.05和1.10时得到最大值.
The Bi x FeO3 thin films with x increasing from 0.80 to 1.20 were prepared on Si substrate by sol-gel technique.The influence of Bi content on the microstructure and optical properties of BFO thin films was analyzed, Bi2Fe4O9 hybrid phase and iron oxide heterogeneous phase appeared in the Bi excess Bi x FeO3 thin film samples, which led to the change of rhombic twisted structure of the Bi x FeO3 thin film.The Raman scattering spectrum and elliptical polarization spectrum of the film were obtained, The Raman scattering spectra show that the vibrational modes in the Bi x FeO3 thin film samples are significantly affected by the value of x. The fitting results of the ellipsometric data show that the refractive index decreases with the decrease of x within the wavelength below 600 nm While the band gap of the sample ranged from 2.65 eV to 2.76 eV, getting the maximum at x 1.05 and 1.10.