A thin film ^10B sample for measuring the atom number

• 作 者: ZHANG Jiaguo WU Hao ZHANG Guoh
• 机 构: StateKeyLaboratoryofNuclearPhysicsandTechnology
• 出 处: 核技术：英文版
• 发表日期: 2010年2期
• 关键词: 样品测量 薄膜样品 原子数 屏栅电离室 核反应 微分截面 中子通量 热中子 ^10B thin film sample Reference ^10B samp
• 基金项目: Supported by National Natural Science Foundation of China （10575006 and 10811120014） and China Nuclear Data Center.Mr. Fan Qiwen from CIEA is acknowledged for preparing the thin ^10B sample. The autho

In order to measure differential cross sections of the 10B(n,α)7Li reaction induced by MeV neutrons using the forward-backward coincidence method, a thin film 10B sample was designed and the 10B atom number was determined with a reference 10B film sample.