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用X射线衍射线形分析中的积分宽度法测定材料的嵌镶块尺寸和显微畸变时,涉及到解决这两种效应引起的线形宽化函数M(x)和N(x)的选型及其积分宽度的计算问题。本文提出了柯西平方法。在引进了关键参数K~*后,对该法提出简捷计算法,简化了bIcak法,并对传统的三种方法和柯西平方法提供了精度很高的直接计算公式,从而使手工离线计算和在线计算成为可能。本方法测算嵌镶块尺寸和显微畸变具有简单、适用性广、精确度高等特点。
When using the integral width method of X-ray diffraction linear analysis to determine the mosaic size and the micro-distortion of the material, it involves the selection of the linear function M (x) and N (x) to solve these two effects The calculation of the integral width of the problem. This paper proposes Cauchy flattening method. After the key parameter K ~ * was introduced, a simple and easy calculation method was proposed to simplify the bIcak method and provided a high-precision direct calculation formula for the traditional three methods and the Cauchy flat method, so that the manual offline calculation and Online calculation is possible. The method for calculating the embedded mosaic block size and the microscopic distortion is simple, wide applicability, high accuracy and the like.