论文部分内容阅读
运用飞行时间质谱分析方法，对XeCI准分子激光烧蚀多种SiO2多孔结构材料而产生的团簇进行了研究，在负离子通道中得到了丰富的[（SiO2）nX］-团簇，实验结果表明延迟时间及材料的多孔网络结构和表面活性基因对［（SiO2）nX］-团簇的检测与产生有重要作用．
Using time-of-flight mass spectrometry, XeCI excimer laser ablation of a variety of SiO2 porous structure of the material generated clusters were studied in the anion channel was rich in [(SiO2) nX] - clusters, the experimental results show that Delay time and porous network structure of materials and surface active genes play an important role in the detection and generation of [(SiO2) nX] - clusters.