Microstructural Probing of （1-x） GeS2- x Ga2S3 System Glasses By Raman Scattering

• 作 者: TAO Haizheng ZHAO Xiujian JING
• 机 构: KeyLaboratoryofSilicateMaterialsScienceandEngineering
• 出 处: 武汉理工大学学报：材料科学英文版
• 发表日期: 2005年3期
• 关键词: 微观结构 RAMAN散射 GeS2-x Ga2S3系统 玻璃 （ 1 - x ） GeS2-x Ga2S3 system glasses Raman m
• 基金项目: 中国科学院资助项目，武汉理工大学校科研和教改项目，Wuhan University of Technology

Raman scattering measurement of ( 1 - x) GeS2-x Ga2S3 system glasses was conducted in order to understand the microstructural change caused by the addition of Ga2 S3. According to the change of Raman spectra with the addition of Ga2 S3, two main structura