Test Derivation Through Critical Path Transitions

• 作 者: 李卫东 魏道政
• 机 构: CAD Laboratory Institute of Computing Technology,Academia Sinica,Beijing 100080,CAD Laboratory,Insti
• 出 处: Journal of Computer Science and Technology
• 发表日期: 1992年01期
• 关键词: derivation attempt guarantee tracing aiming promotion usefulness transitions sim

In this paper,a new technique called test derivation is presented,aiming at the promotion of therandom testing efficiency for combinational circuits.Combined with a fault simulator based on criticalpath tracing method,we introduce the concept of seed test derivation and attempt to generate a groupof new tests from the seed test by means of critical path transition.The necessary conditions and effi-cient algorithms are proposed to guarantee the usefulness of the newly derived tests and the correctnessof the critical path transitions.Also,examples are given to demonstrate the effectiveness of thetechnique.

In this paper, a new technique called test derivation is presented, aiming at the promotion of the random test capability for combinational circuits. Combined with a fault simulator based on critical path tracing method, we introduce the concept of seed test derivation and attempt to generate a groupof new tests from the seed test by means of critical path transition.The necessary conditions and effi-cient algorithms are proposed to guarantee the usefulness of the newly derived tests and the correctness of the critical path transitions.Also, examples are given to demonstrate the effectiveness of thetechnique.