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X-荧光光谱法(XRF法)用于测定稀土无机化合物已有许多应用,但在测定有机及高分子化合物中金属元素、磷、卤素、硅含量方面的应用尚未见到过报道。一般用化学法测定,需先除去或破坏有机物(或高分子)后才能测定,手续繁多。对交联聚合物因不能溶解更难以测定。我们用XRF法测定了高分子金属配合物中稀土元素的含量,含硅交联树脂中硅的含量以及有机物中磷的含量。简要方法如下:测定可溶性样品时用与薄样法类似的点滴滤纸法,分别以稀土硝酸盐、氯化钠、磷酸二氢钾为标准样品,测定稀土、氯、磷含量
X-ray fluorescence spectrometry (XRF method) has been used in the determination of rare earth inorganic compounds have many applications, but in the determination of organic and polymer compounds of metal elements, phosphorus, halogen, silicon content has not been reported. Generally measured by chemical methods, you need to remove or destroy organic matter (or polymer) before the determination, a large number of procedures. It is more difficult to determine the cross-linked polymer because it can not dissolve. We used the XRF method to determine the content of rare earth elements in the macromolecular metal complexes, the content of silicon in the silicon-containing crosslinked resins and the content of phosphorus in the organic matter. Brief methods are as follows: Determination of soluble samples with thin sample method similar to the trickle filter paper, respectively, nitrate, sodium chloride, potassium dihydrogen phosphate as a standard sample, determination of rare earth, chlorine, phosphorus content