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提出了用调制光谱信号强度表征半导体体材料及微结构的非线性极化率，研究了测量的原理和方法．对玻璃中量子点电反射调制光谱信号强度随团簇颗粒尺寸的不同而产生几个数量级变化的原因作出了解释
The nonlinear polarizability of semiconductor materials and microstructures was characterized by modulated signal intensity, and the principle and method of measurement were studied. An explanation is given of the reason why the signal intensity of the modulated electrical signal in the quantum dots of a glass varies several orders of magnitude depending on the particle size of the cluster