Sulfonated polyetherketone (SPEK-C) films investigated by positron annihilation lifetime spectroscop

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The characterization of sulfonated polyetherketone (SPEK-C) films was investigated by using positron annihilation lifetime spectroscopy (PALS) and atomic force microscopy (AFM). It was found that free volume radius and intensity depend on the variation of sulfonation degree and solvent evaporation time of the films. Pore size and distribution determined from PALS and AFM measurements showed reasonable agreement.
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