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阐述了ＩＣＰ－ＡＥＳ专家系统中ＡＥＳ电离和激发模型的基本原理，研究了模拟中应用ｎｏｎ－ＬＴＥ理论的正确性以及所需的支持数据库。利用 Ｂｏｌｔｚｍｎａｎｎ曲线，讨论了 Ｂｏｌｔｚｍａｎｎ温度的测量值随能级激发能而变化的现象，并与类似条件下的实验Ｂｏｌｔｚｍａｎｎ曲线进行了对比，证明了专家系统中ＡＥＳ电离和激发模型的可靠性。
The basic principle of AES ionization and excitation model in ICP-AES expert system is expounded. The correctness of applying non-LTE theory in simulation and the supporting database required are also discussed. Using the Boltzmnann curve, the phenomenon that the measured value of Boltzmann temperature varies with the energy level is discussed and compared with the experimental Boltzmann curve under similar conditions. The reliability of the AES ionization and excitation model in an expert system is proved.