Feature evaluation and extraction based on neural network in analog circuit fault diagnosis

• 作 者: Yuan Haiying Chen Guangju Xie
• 机 构: School of Automation Engineering
• 出 处: 系统工程与电子技术（英文版）
• 发表日期: 2004年期
• 关键词: Fault diagnosis Feature extraction Analog circuit Neural network Principal compo

Choosing the right characteristic parameter is the key to fault diagnosis in analog circuit.The feature evaluation and extraction methods based on neural network are presented.Parameter evaluation of circuit features is realized by training results from neural network; the superior nonlinear mapping capability is competent for extracting fault features which are normalized and compressed subsequently.The complex classification problem on fault pattern recognition in analog circuit is transferred into feature processing stage by feature extraction based on neural network effectively, which improves the diagnosis efficiency.A fault diagnosis illustration validated this method.