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利用静电力显微镜(EFM)研究了二相材料不同区域的介电特性.制备了高定向石墨/聚乙烯、云母/聚乙烯等层叠状二相材料复合物,在EFM相位检测模式下观测二相材料过渡界面处,可以发现二相材料中介电常数较大的材料会引起较大的相位滞后角θ该相位滞后角正切值tan(θ)与探针电压VEFM存在二次函数关系,且函数二次项系数与样品的介电常数存在增函数关系,进而可在微纳米尺度下区分不同微区域内材料的介电常数差异.研究表明EFM可用于对材料介电特性的微纳米尺度测量,这对分析复合材料二相界面区域特性有积极意义.
The dielectric properties of different regions of two-phase material were studied by using electrostatic force microscope (EFM), and two-phase composite materials of high orientation graphite / polyethylene, mica / polyethylene were prepared, and two phases were observed in EFM phase detection mode At the material transition interface, it can be found that materials with larger dielectric constants in the two-phase material cause a larger phase lag angle θ. The phase tangent tan (θ) has a quadratic function relationship with the probe voltage VEFM, and the function The quadratic coefficient and the dielectric constant of the sample have an increasing function, which can be used to distinguish the difference of the dielectric constants in different micro-regions at the micro-nano scale.The results show that the EFM can be used to measure the dielectric properties of materials, This is of great significance for the analysis of the properties of the interface between two phases in composite materials.