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本文叙述了用X光激发的光学荧光分析技术测定二氧化锆和锆合金中微量稀土元素Sm,Eu,Gd和Dy。将K_2CO_3,Sr(NO_3)_2,ZrO_2和WO_3按克分子比1∶2∶5∶3混合,于1000℃灼烧两小时生成组成为K_2O·2 SrO·5 ZrO_2·3 WO_3的四元氧化物磷光体。在X光照射下,磷光体中的稀土元素发出线状荧光光谱,记录此荧光强度以测定样品中稀土元素的含量。本文研究了磷光体制备和测量的适宜条件。在给定的条件下,标准曲线的测定下限能达到:Sm,Dy———0.15 ppm;Eu,Gd——0.3 ppm。
This paper describes the determination of trace rare earth elements Sm, Eu, Gd and Dy in zirconium dioxide and zirconium alloys by optical fluorescence spectrometry. K 2 CO 3, Sr (NO 3) 2, ZrO 2 and WO 3 were mixed at molar ratio of 1: 2: 5: 3 and calcined at 1000 ℃ for two hours to generate quaternary oxide with composition of K 2 O 2 SrO · 5 ZrO 2 · 3 WO 3 Phosphor. Under X-ray irradiation, the rare earth element in the phosphor emits a linear fluorescence spectrum, and the fluorescence intensity is recorded to determine the content of rare earth elements in the sample. In this paper, the suitable conditions for the preparation and measurement of phosphors were studied. Under the given conditions, the lower limit of the standard curve can be achieved: Sm, Dy --- 0.15 ppm; Eu, Gd - 0.3 ppm.