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在２００ｋｅＶ重离子加速器上，用１２０—３６０ｋｅＶ的Ｈ，Ｎ，Ａｒ和Ｍｏ离子注入Ｃ６０薄膜．对注入后薄膜的拉曼谱进行了分析．结果表明，不同离子注入Ｃ６０薄膜后，Ｃ６０的１４６９ｃｍ－１特征峰随注入剂量的增加均呈指数式下降，同时在１３００—１７００ｃｍ－１范围出现非晶碳峰，并逐渐增强，最终完全非晶化．而且１４６９ｃｍ－１拉曼峰的强度及Ｃ６０薄膜完全非晶化所对应的剂量与注入离子的种类和能量有关．进一步的分析表明，Ｃ６０分子的损伤主要是由注入离子的核能量转移所造成，与电子能量转移无关．Ｈ离子注入Ｃ６０薄膜后，１４６９ｃｍ－１处特征拉曼峰向短波方向非对称展宽，这可能是注入的Ｈ离子通过电子能量转移使Ｃ６０分子发生聚合的结果
The C60 film was implanted with H, N, Ar and Mo ions at 120-360 keV on a 200 keV heavy ion accelerator. The Raman spectra of the implanted films were analyzed. The results showed that the characteristic peaks of 1469cm-1 of C60 decreased exponentially with the implantation dose of C60 film, and the peak of amorphous carbon appeared in the range of 1300-1700cm-1 and gradually increased. The final complete amorphous The Moreover, the intensity of the 1469 cm-1 Raman peak and the complete amorphization of the C60 film are related to the type and energy of the implanted ions. Further analysis shows that the damage of C60 molecule is mainly caused by the nuclear energy transfer of implanted ions, which has nothing to do with the electron energy transfer. After H ion implantation into C60 film, the characteristic Raman peak at 1469cm-1 spreads to the short wave direction asymmetrically, which may be the result of the injected H ions polymerizing C60 molecules by electron energy transfer