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作者研制了一种新的X射线残余应力分析仪器,可以同时对0°～45°的衍射进行测量。这是由于具有单灯丝双靶的X射线管能同时产生两束平行X射线。这种新仪器还包括与新管相适应的测角仪和电子计算线路的设计。因此,有如下效果: (1) 由于光程较短和X射线管的负载增加,便使X射线强度提高到普通X射线应力分析仪的三十倍左右。 (2) 由于对两个方向的反射能同时测量和记录,使测量时间缩短为普通X射线应力分析仪的十分之一,甚至更少。 (3) 使用台式计算器,可以大大缩短数据处理时间,并有可能对抛物线型衍射图进行残余应力的估算。 (4) 由于X射线强度增加,便可在应力测定点同时进行残余奥氏体的高精度定量分析。
The authors developed a new X-ray residual stress analysis instrument that can simultaneously measure diffraction from 0 ° to 45 °. This is because an X-ray tube with a single filament double target can generate two parallel X-rays simultaneously. The new instrument also includes a goniometer adapted to the new tube and an electronic computing circuit design. Therefore, there are the following effects: (1) The X-ray intensity is raised to about thirty times that of the ordinary X-ray stress analyzer due to the short optical path length and the increase of the load of the X-ray tube. (2) The measurement time can be shortened to one-tenth or less of that of an ordinary X-ray stress analyzer, since the reflection in both directions can be measured and recorded simultaneously. (3) The use of a bench-top calculator greatly reduces data processing time and makes it possible to estimate the residual stress of parabolic diffractograms. (4) High-precision quantitative analysis of retained austenite can be simultaneously performed at the stress measurement point due to the increase of X-ray intensity.