,Cross Sections of Electron Detachment for Si- and Ge- in Collision with Ar

• 作 者: GAO Mei YANG En-Bo LIU Yong ZHANG Xue-Mei LU Fu-Quan
• 机 构: Key Lab of Applied Ion Beam Physics of MOE, Fudan University, Shanghai 200433“,”Shanghai EBIT Lab, I
• 出 处: 中国物理快报（英文版）
• 发表日期: 2006年12期

Single electron detachment cross section for 10-40keV Si- and Ge- in collisions with Ar are measured and compared with other available experimental results. In our experimental energy region, the trend of cross sections is almost constant. The cross sections of Ge larger than Si can be understood by including electron affinity and size of negative ions.PACS: 34. 70. +e, 34. 50. Dy