Sulfonated polyetherketone (SPEK-C) films investigated by positron annihilation lifetime spectroscop

• 作 者: Htwe Htwe Yin
• 机 构: Department of Modern Physics University of Science and Technology of China Hefei 230026 China,
• 出 处: Nuclear Science and Techniques
• 发表日期: 2005年06期
• 关键词: lifetime positron evaporation ascending radius macroscopic struc solubility Memb

The characterization of sulfonated polyetherketone (SPEK-C) films was investigated by using positronannihilation lifetime spectroscopy (PALS) and atomic force microscopy (AFM). It was found that free volume radiusand intensity depend on the variation of sulfonation degree and solvent evaporation time of the films. Pore size anddistribution determined from PALS and AFM measurements showed reasonable agreement.

The characterization of sulfonated polyetherketone (SPEK-C) films was investigated by using positronannihilation lifetime spectroscopy (PALS) and atomic force microscopy (AFM). It was found that free volume radius and intensity depend on the variation of sulfonation degree and solvent evaporation time of the films. Pore size anddistribution determined from PALS and AFM measurements showed reasonable agreement.