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Dithering optimization techniques can be divided into the phase-optimized technique and the intensity-optimized technique.The problem with the former is the poor sensitivity to various defocusing amounts,and the problem with the latter is that it cannot enhance phase quality directly nor efficiently.In this paper,we present a multi-objective optimization framework for three-dimensional (3D) measurement by utilizing binary defocusing technique.Moreover,a binary patch optimization technique is used to solve the time-consuming issue of genetic algorithm.It is demonstrated that the presented technique consistently obtains significant phase performance improvement under various defocusing amounts.