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提出一种新的、基于行列式判决图的模拟集成电路输出参数测试方法。利用 Laplace展开 ,可以建立被测电路导纳矩阵的行列式判决图 ,从而计算出其输出参数—例如增益和截止频率。对于大规模模拟电路来说 ,由于导纳矩阵的稀疏性和行列式子图的共享性 ,该方法能够有效地测试出被测电路的输出参数。
A new test method for output parameters of analog integrated circuits based on determinant graph is proposed. Using Laplace expansion, the determinant of the admittance matrix of the circuit under test can be established to calculate its output parameters such as gain and cutoff frequency. For large-scale analog circuits, this method can effectively test the output parameters of the circuit under test due to the sparsity of admittance matrix and the sharing of determinant subgraphs.