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透射电子显微镜与X射线能量色散分析联合使用有助于对细粒沉积物的全样与个别矿物组份化学成份的测定。从所获得的资料可以计算沉积物的矿物成份,而无需用X射线粉末衍射法作矿物分析。
Transmission electron microscopy and energy dispersive X-ray analysis coupled with the help of the whole sample of fine sediment and the determination of the chemical composition of individual mineral components. From the data obtained, it is possible to calculate the mineral content of sediments without the need for mineral analysis by X-ray powder diffraction.