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利用化学溶液技术制备了具有单一白钨矿结构的SrMoO4多晶薄膜。用X射线衍射仪(XRD)分析了薄膜的晶相结构,用红外光谱(IR)对薄膜的均一性进行了表征,用原子力显微镜(AFM)对薄膜的表面形貌进行了观察。采用荧光光谱仪测试了所制SrMoO4薄膜在不同温度下的光致发光特性。研究结果表明,在276nm的紫外光激发下,钼酸锶薄膜室温条件下显示出良好的光致发光特性,呈现宽带(～300nm)的发光特征。另外,光致发光光谱的峰值呈现出明显的温度漂移特性,从511nm(11K)变化到484nm(293K)。此外,本文还讨论了SrMoO4薄膜在闪烁材料和紫外成像薄膜材料方面的可能应用。
SrMoO4 polycrystalline thin films with single scheelite structure were prepared by chemical solution technology. The crystal structure of the films was analyzed by X-ray diffractometer (XRD). The uniformity of the films was characterized by infrared spectroscopy (IR). The surface morphology of the films was observed by atomic force microscopy (AFM). The photoluminescence properties of SrMoO4 films prepared at different temperatures were tested by fluorescence spectroscopy. The results show that strontium molybdate films show good photoluminescence properties at room temperature under the excitation of 276 nm UV light, exhibiting a broadband (~ 300 nm) luminescence. In addition, the peak value of the photoluminescence spectrum shows a significant temperature drift characteristic from 511 nm (11K) to 484 nm (293K). In addition, this article also discusses the possible applications of SrMoO4 thin films in scintillation and UV imaging thin film materials.