Algorithms for Masking Pixel Defects at Low Exposure Conditions for CMOS Image Sensors

• 作 者: Vinesh Sukumar Jason Tanner At
• 机 构: 不详
• 出 处: 工程(英文)(1947-3931)
• 发表日期: 2010年4期
• 关键词: Hot PIXELS PIXEL CLUSTERS DEFECT CORRECTION Cluster CORRECTION Hot Pixels Pixel

This paper introduces certain innovative algorithms to mask for pixel defects seen in image sensors. Pixel defectivity rates scale with pixel architecture and process nodes. Smaller pixel and process nodes introduce more defects in manufacturing. Brief in