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用MBE技术外延生长了Pb_(1-x)Eu_xTe薄膜及PbTe/Pb_(1-x)Eu_xTe超晶格。对单层薄膜进行了红外透射谱及光激瞬态电流谱的测量。对超晶格材料进行x光衍射测量。结果表明材料的性能优良。
Pb_ (1-x) Eu_xTe films and PbTe / Pb_ (1-x) Eu_xTe superlattices were epitaxially grown by MBE technique. The single-layer films were measured by infrared transmission spectroscopy and photo-induced transient current spectroscopy. X-ray diffraction measurements of the superlattice material. The results show that the material performance is excellent.