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本文用X射线分析和差热分析方法测定了Er≤50at.-%区域内的Er-Ge二元系相图。在此成分区域内观察到三种化合物:ErGe_2,Er_2Ge_3和ErGe。在Ge和ErGe_2之间有一个共晶反应,共晶点成分是23at.-%Er,共晶温度是866℃。有两个包晶反应:在900℃形成化合物ErGe_2,在1043℃形成化合物Er_2Ge_3。差热分析表明,ErGe_2在886℃时,发生多型性变化。没有观察到Er在Ge里的固溶度。
In this paper, the Er-Ge binary system phase diagram with Er≤50at .-% was determined by X-ray diffraction and differential thermal analysis. Three compounds were observed in this component area: ErGe_2, Er_2Ge_3 and ErGe. There is a eutectic reaction between Ge and ErGe_2 with a eutectic composition of 23 at .-% Er and a eutectic temperature of 866 ° C. There are two peritectic reactions: the compound ErGe 2 is formed at 900 ° C and the compound Er 2 Ge 3 is formed at 1043 ° C. Differential thermal analysis shows that the polymorphism of ErGe_2 occurs at 886 ℃. Er did not observe the solid solubility of Er in Ge.