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为研究材料反射比随波长的变化,建立了基于光栅单色仪和积分球的定向-半球光谱反射比测量系统。用定向-半球反射比为0.5的标准灰板对系统性能进行检验,并对系统中各因素对测量结果的影响进行了分析。对与太阳能利用相关的材料在350~1100nm范围内的定向-半球光谱反射比进行了测量。系统稳定性好,多次测量的标准偏差远小千0.5%;精度高.系统的的测量误差可以控制在0.8%以内;系统扩展性强,适当调整配置,可测量定向-半球光谱透射比。
In order to study the change of material reflectance with wavelength, a directional-hemisphere spectral reflectance measurement system based on grating monochromator and integrating sphere was established. The performance of the system was tested with a standard gray plate with a directional-hemispherical reflectance of 0.5. The influence of various factors on the measurement results was also analyzed. Directional-hemispherical spectral reflectances in the range of 350-1100 nm for materials related to solar energy utilization were measured. The system has good stability, the standard deviation of multiple measurement is far less than 0.5%, the precision is high, the measurement error of the system can be controlled within 0.8%, the system is scalable and the configuration can be properly adjusted to measure the directional-hemisphere spectral transmittance.