论文部分内容阅读
在不同Na5P3O10含量的电解液体系下对氢化锆进行微弧氧化。采用HCC-25型电涡流测厚仪测量氧化膜厚度,采用XRD、SEM分析膜层的相结构和截面形貌,采用真空脱氢实验测试膜层的阻氢性能,研究电解液中Na5P3O10含量对膜层厚度、结构、截面形貌和阻氢性能的影响。结果表明:随着电解液中Na5P3O10质量浓度从14g/L增加到22g/L,膜层厚度由50μm增加至160μm;微弧氧化膜的结构随着Na5P3O10质量浓度的增加无明显变化,主要由M-ZrO2和T-ZrO1.88组成;膜层的阻氢性能随着Na5P3O10质量浓度的增加呈现先增大后减小的趋势,当Na5P3O10质量浓度为18g/L时膜层的阻氢性能最佳。
Zirconium hydride was micro-arc oxidized under different Na5P3O10 content. The thickness of the oxide film was measured by HCC-25 eddy current thickness gauge. The phase structure and cross-sectional morphology of the film were analyzed by XRD and SEM. The hydrogen dehydrogenation of the film was tested by vacuum dehydrogenation experiment. The effect of Na5P3O10 content Film thickness, structure, cross-sectional morphology and hydrogen barrier properties. The results showed that the thickness of the coating increased from 50μm to 160μm with the increase of the concentration of Na5P3O10 in the electrolyte from 14g / L to 22g / L. The structure of the MAO film did not change obviously with the increase of the mass concentration of Na5P3O10, -ZrO2 and T-ZrO1.88. The hydrogen barrier properties of the films first increased and then decreased with the increase of the mass concentration of Na5P3O10. When the mass concentration of Na5P3O10 was 18g / L, the hydrogen barrier properties of the films were the best .