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采用正交偏光条纹检测仪观察了水热法生长的光学石英晶体中的条纹缺陷,分析了光学石英晶体中条纹缺陷产生的原因和对晶体样品的透过率的影响。结果表明:晶体中的条纹缺陷主要是由在生长过程中籽晶中缺陷的遗传和高压釜中局部生长条件变化引起的。有条纹和无条纹缺陷晶体在400～800nm波段存在最高吸收峰,800～2500nm波段存在最低吸收峰。有条纹缺陷和无条纹缺陷晶体样品的透过率存在0.64%的差异。
The streak defects in the optical quartz crystal grown by hydrothermal method were observed by orthogonal polarized stripe detector. The causes of streak defects in the optical quartz crystal and the influence on the transmittance of the crystal sample were analyzed. The results show that the streak defects in the crystal are mainly caused by the inheritance of the defects in the seed during growth and the local growth conditions in the autoclave. Striped and stripe-free crystals have the highest absorption peak in the 400-800 nm band and the lowest absorption band in the 800-2500 nm band. There is a 0.64% difference in the transmittance of the striped and non-striped defect crystal samples.