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发射率是材料热特性中一种比较难测的参数,而常温物体发射率的测量难度更大,目前国际上公认的发射率测量精度一般为2.2～5.4%。由中国科学院上海技术物理研究所研制的IR-1型发射率测量仪是一种用于测定常温物体发射率的高精度测量装置,它采用一种与经典测量方法完全不同的双圆筒、双辐射计的新思路。其主要特点是:(1)测量精度高、重
Emissivity is a relatively difficult parameter in the thermal properties of materials. However, it is more difficult to measure the emissivity of objects at room temperature. At present, the internationally accepted accuracy of emissivity measurement is generally 2.2-5.4%. The IR-1 emissivity meter, developed by the Shanghai Institute of Technical Physics, Chinese Academy of Sciences, is a high-precision measuring device for measuring the emissivity of objects at ambient temperature. It uses a completely different double cylinder, double Radiometer new ideas. Its main features are: (1) measurement accuracy, weight