论文部分内容阅读
应用激光全息干涉、二次曝光技术,同时获得反射纹与透射纹的全息图。联立求解对应两组条纹的两方程可分别解出样品折射率均勾性△n与厚度均匀△L的平面分布。在光路中加偏振片,还能分别测出样品寻常光折射率均匀性△n_0和非寻常光折射率均匀性△n_e的平面分布。通过对应点逐点计算,即可求出双折射率梯度A=△(n_e-n_0)/△Z。
Application of laser holographic interference, double exposure technology, at the same time get reflective lines and transparent lines hologram. The simultaneous solving of the two equations corresponding to the two sets of fringes can solve the plane distributions of the mean and the uniform thickness of sample, respectively. Polarizer is added in the optical path, and the plane distribution of the normal refractive index uniformity Δn_0 and the extraordinary refractive index uniformity Δn_e of the sample can also be measured respectively. Through the corresponding point by point calculation, you can find the birefringence gradient A = △ (n_e-n_0) / △ Z.