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查明造成半导体器件损坏的电过载(EOS)事件的根源是有难度的，而EOS事件出现无规律性时难度会更大。为阐明如何才能对EOS事件追根溯源，在此用一个实例说明我们是如何帮助一位用户辩认两种运算放大器(op amps)的失效原因的。初步、检查第一种运算放大器OP1遭到一个大型的EOS事
It is difficult to pinpoint the root cause of electrical overload (EOS) events that cause damage to semiconductor devices and to make it more difficult to visualize EOS events. To illustrate how EOS events can be traced back, here’s an example of how we can help a user identify the causes of the failure of two types of op amps. Preliminary, check the first op amp OP1 was a large EOS thing